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件名：LCSH:Materials -- Defects -- Congresses
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| | 資料名 | 所蔵館 | 責任表示 | 出版者 | 出版年 | 所在 |
| 1 |  | Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. v. 1 , v. 2 | 中央図書館 | edited by K. Sumino. | North-Holland, Distributors for the U.S. and Canada, Elsevier Science Pub. Co. | 1990 | 中央５階洋 549.8||D 53||1
中央５階洋 549.8||D 53||2 |
| 2 | | Defects and fracture : proceedings of First International Symposium on Defects and Fracture, held at Tuczno, Poland, October 13-17, 1980 | 中央図書館 | edited by G.C. Sih, H. Zorski. | M. Nijhoff | 1982 | 中央５階洋 501.324||D 53 |
| 3 | | Defects, fracture, and fatigue : proceedings of second international symposium, held at Mont Gabriel, Canada, May 30-June 5, 1982 | 中央図書館 | edited by G.C. Sih, J.W. Provan. | M. Nijhoff, Distributors for the U.S. and Canada, Kluwer Boston | 1983 | 中央５階洋 501.324||D 53 |
| 4 | | Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A. ( Materials Research Society symposium proceedings ; v. 209 ) | 中央図書館 | editors, Paul D. Bristowe ... [et al.] | Materials Research Society | 1991 | 中央５階洋 501.5||D 53 |
| 5 | | High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA ( Materials Research Society symposium proceedings ; v. 183 ) | 中央図書館 | editors, Robert Sinclair, David J. Smith, Ulrich Dahmen | Materials Research Society | 1990 | 中央５階洋 501.324||H 55 |
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