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書誌情報:Characterization of shielded coplanar type transmission line junction discontinuities considering the finite metalization thickness effect
by Chih-Wen Kuo.
: , 1991.
ix, 84 leaves : ill. ; 29 cm.


  


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書誌詳細
刊年1991
形態ix, 84 leaves : ill. ; 29 cm.
別書名Finite metalization thickness effect.
注記Vita.
Thesis (Ph. D.)--University of Texas at Austin, 1991.
Includes bibliographical references (leaves 80-84).
Photocopy. Ann Arbor, MI : UMI, 1992. 22 cm.
出版国[出版地不明]，又は[s.l.]
標題言語英語
本文言語英語
著者情報Kuo, Chih-Wen, 1964-
件名LCSH:Microwavetransmissionlines.
LCSH:Impedance(Electricity)
LCSH:Eigenvalues.

   
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